Код: Выделить всё
/dev/ad4 -a -m admin@informa.ru -o on -S on -s (S/../.././22|L/../../6/23)
/dev/ad6 -a -m admin@informa.ru -o on -S on -s (S/../.././22|L/../../6/23)
/dev/ad8 -a -m admin@informa.ru -o on -S on -s (S/../.././22|L/../../6/23)
Код: Выделить всё
Sep 9 22:05:02 alpha kernel: ad6: FAILURE - WRITE_DMA48 status=51<READY,DSC,ERROR> error=10<NID_NOT_FOUND> LBA=402129023
Sep 9 22:05:02 alpha kernel: GEOM_MIRROR: Request failed (error=5). ad6[WRITE(offset=205890059776, length=114688)]
Sep 9 22:05:02 alpha kernel: GEOM_MIRROR: Device gm0: provider ad6 disconnected.
Sep 9 22:09:27 alpha smartd[94291]: Device: /dev/ad6, ATA error count increased from 79 to 80
тесты dd на чтение и запись ad6 ошибок не выдали. диск добавился обратно в райд и проработал пару дней без проблем. включил опять smartd и в тот же вечер
Код: Выделить всё
Sep 19 22:03:19 alpha kernel: ad6: FAILURE - WRITE_DMA48 status=51<READY,DSC,ERROR> error=10<NID_NOT_FOUND> LBA=426334047
Sep 19 22:03:19 alpha kernel: GEOM_MIRROR: Request failed (error=5). ad6[WRITE(offset=218283032064, length=2048)]
Sep 19 22:03:19 alpha kernel: GEOM_MIRROR: Device gm0: provider ad6 disconnected.
Sep 19 22:08:09 alpha smartd[87992]: Device: /dev/ad6, ATA error count increased from 80 to 81
как-то ошибка чтения по времени оба раза совпала с запуском шорт-теста. чего может быть?
смарт диска
Код: Выделить всё
[root@alpha ~]# smartctl -a /dev/ad6
smartctl 5.41 2011-06-09 r3365 [FreeBSD 7.4-STABLE amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital RE2 Serial ATA
Device Model: WDC WD4001ABYS-01YNA0
Serial Number: WD-WCAS90015728
LU WWN Device Id: 5 0014ee 2ab9c977b
Firmware Version: 59.01D01
User Capacity: 400 088 457 216 bytes [400 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Tue Sep 20 11:59:01 2011 MSD
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (10980) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 129) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 2
3 Spin_Up_Time 0x0003 176 176 021 Pre-fail Always - 6166
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 69
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 063 063 000 Old_age Always - 27492
10 Spin_Retry_Count 0x0012 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 67
192 Power-Off_Retract_Count 0x0032 001 001 000 Old_age Always - 590103
193 Load_Cycle_Count 0x0032 004 004 000 Old_age Always - 590106
194 Temperature_Celsius 0x0022 124 102 000 Old_age Always - 26
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 7
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 81 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 81 occurred at disk power-on lifetime: 27478 hours (1144 days + 22 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 04 5f 57 69 40 Error: IDNF 4 sectors at LBA = 0x0069575f = 6903647
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 04 5f 57 69 19 00 42d+09:20:46.099 WRITE DMA EXT
ca 00 20 5f 38 2d 05 00 42d+09:20:46.029 WRITE DMA
35 00 20 ff 13 69 19 00 42d+09:20:46.009 WRITE DMA EXT
35 00 20 7f 07 ea 1f 00 42d+09:20:46.009 WRITE DMA EXT
35 00 20 ff 12 69 19 00 42d+09:20:45.933 WRITE DMA EXT
Error 80 occurred at disk power-on lifetime: 27237 hours (1134 days + 21 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 e0 7f 00 f8 40 Error: IDNF 224 sectors at LBA = 0x00f8007f = 16253055
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 e0 7f 00 f8 17 00 32d+09:36:35.738 WRITE DMA EXT
35 00 20 ff e9 f3 17 00 32d+09:36:35.236 WRITE DMA EXT
35 00 20 9f 01 f7 17 00 32d+09:36:35.235 WRITE DMA EXT
35 00 20 df 4d d8 17 00 32d+09:36:35.065 WRITE DMA EXT
ca 00 20 df 0e d9 02 00 32d+09:36:35.065 WRITE DMA
Error 79 occurred at disk power-on lifetime: 25265 hours (1052 days + 17 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 20 df b3 f6 40 Error: IDNF 32 sectors at LBA = 0x00f6b3df = 16167903
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 20 df b3 f6 17 00 3d+10:44:46.812 WRITE DMA EXT
25 00 14 1f 58 52 18 00 3d+10:44:46.538 READ DMA EXT
35 00 20 ff e9 f3 17 00 3d+10:44:46.494 WRITE DMA EXT
35 00 20 df b3 f6 17 00 3d+10:44:46.493 WRITE DMA EXT
25 00 14 bf 55 52 18 00 3d+10:44:46.013 READ DMA EXT
Error 78 occurred at disk power-on lifetime: 25265 hours (1052 days + 17 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 67 c9 7a 40 Error: UNC 4 sectors at LBA = 0x007ac967 = 8046951
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 04 67 c9 7a 1b 00 3d+10:44:01.048 READ DMA EXT
35 00 20 ff e9 f3 17 00 3d+10:44:00.983 WRITE DMA EXT
35 00 20 7f b3 f6 17 00 3d+10:44:00.983 WRITE DMA EXT
35 00 40 5f 9b 60 1a 00 3d+10:44:00.886 WRITE DMA EXT
25 00 04 1f 83 6e 1b 00 3d+10:44:00.771 READ DMA EXT
Error 77 occurred at disk power-on lifetime: 25265 hours (1052 days + 17 hours)
When the command that caused the error occurred, the device was doing SMART Offline or Self-test.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 14 5f 8e 51 40 Error: UNC 20 sectors at LBA = 0x00518e5f = 5344863
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 14 5f 8e 51 18 00 3d+10:43:31.638 READ DMA EXT
25 00 04 93 bc 5a 1c 00 3d+10:43:31.329 READ DMA EXT
c8 00 04 4f 85 25 03 00 3d+10:43:31.250 READ DMA
25 00 08 1f 5e 74 24 00 3d+10:43:31.241 READ DMA EXT
25 00 80 9f 49 6f 20 00 3d+10:43:31.231 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 27478 -
# 2 Short offline Completed without error 00% 27285 -
# 3 Extended offline Completed without error 00% 27265 -
# 4 Short offline Completed without error 00% 27261 -
# 5 Short offline Completed without error 00% 27237 -
# 6 Short offline Completed without error 00% 25265 -
# 7 Extended offline Aborted by host 90% 25265 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.